Atom Probe Microscopy by Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer.
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and puls...
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Bibliographic Details
| Main Authors: |
Gault, Baptiste
(Author),
Moody, Michael P.
(Author),
Cairney, Julie M.
(Author),
Ringer, Simon P.
(Author) |
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| Corporate Author: |
SpringerLink (Online service) |
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| Format: | eBook
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| Language: | English |
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| Published: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
|
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| Edition: | 1st ed. 2012. |
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| Series: | Springer Series in Materials Science,
160
Springer eBook Collection.
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| Subjects: | |
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| Online Access: | Click to view e-book
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| Holy Cross Note: | Loaded electronically.
Electronic access restricted to members of the Holy Cross Community. |
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