Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.

Annotation This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and...

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Bibliographic Details
Other Authors: Dumin, D. J.
Format: eBook
Language:English
Published: [River Edge, NJ] : World Scientific, ©2002.
Series:Selected topics in electronics and systems ; v. 23.
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Online Access:Click for online access