Electromigration in ULSI interconnections

Electromigration in ULSI interconnections / Cher Ming Tan.

Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on elect...

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Bibliographic Details
Main Author: Tan, Cher Ming, 1959-
Corporate Author: World Scientific (Firm)
Format: eBook
Language:English
Published: Singapore ; Hackensack, N.J. : World Scientific Pub. Co., ©2010.
Series:International series on advances in solid state electronics and technology.
Subjects:
Integrated circuits > Ultra large scale integration.
Electrodiffusion.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Electrodiffusion
Integrated circuits > Ultra large scale integration
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