Nonlinear transistor model parameter extraction techniques / edited by Matthias Rudolph, Christian Fager, David E. Root.

Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.

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Bibliographic Details
Other Authors: Rudolph, Matthias, 1969-, Fager, Christian, Root, David E.
Format: eBook
Language:English
Published: Cambridge, UK ; New York : Cambridge University Press, 2012.
Series:Cambridge RF and microwave engineering series.
Subjects:
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