Atomic layer deposition : principles, characteristics, and nanotechnology applications / Tommi Kääriäinen, David Cameron, Marja-Leena Kääriäinen, and Arthur Sherman.

Since the first edition was published in 2008, Atomic Layer Deposition (ALD) has emerged as a powerful, and sometimes preferred, deposition technology. The new edition of this groundbreaking monograph is the first text to review the subject of ALD comprehensively from a practical perspective. It cov...

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Bibliographic Details
Main Author: Kääriäinen, Tommi
Other Authors: Cameron, David, 1949-, Kääriäinen, Marja-Leena, Sherman, Arthur, 1931-
Format: eBook
Language:English
Published: Hoboken, New Jersey : John Wiley & Sons, [2013]
Subjects:
Online Access:Click for online access