Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China

Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim.

Collection of selected, peer reviewed papers from the 2014 International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China. The 380 papers are grouped as follows: Chapter 1: Measurement Science, Methods and Techniques of Measurements, Chapter...

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Bibliographic Details
Corporate Author: International Conference on Measurement, Instrumentation and Automation Shanghai, China
Other Authors: Yarlagadda, Prasad (Editor), Kim, Yun-Hae (Editor)
Format: eBook
Language:English
Published: Zurich, Switzerland : Trans Tech Publications, [2014]
Series:Applied mechanics and materials ; v. 568-570.
Subjects:
Detectors > Congresses.
Measurement > Congresses.
Measuring instruments > Congresses.
TECHNOLOGY & ENGINEERING > Technical & Manufacturing Industries & Trades.
Detectors
Measurement
Measuring instruments
Conference papers and proceedings
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