Yield-aware analog IC design and optimization in nanometer-scale technologies / António Manuel Lourenço Canelas, Jorge Manuel Correia Guilherme, Nuno Cavaco Gomes Horta.
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enable...
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