Introduction to statistics in metrology

Introduction to statistics in metrology / Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin.

This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studi...

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Bibliographic Details
Main Authors: Crowder, Stephen (Author), Delker, Collin (Author), Forrest, Eric (Author), Martin, Nevin (Author)
Format: eBook
Language:English
Published: Cham, Switzerland : Springer, [2020]
Subjects:
Metrology > Statistical methods.
Measurement > Mathematical models.
Espacios métricos > Modelos matemáticos
Measurement > Mathematical models
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