Introduction to statistics in metrology

Introduction to statistics in metrology / Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin.

This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studi...

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Bibliographic Details
Main Authors: Crowder, Stephen (Author), Delker, Collin (Author), Forrest, Eric (Author), Martin, Nevin (Author)
Format: eBook
Language:English
Published: Cham, Switzerland : Springer, [2020]
Subjects:
Metrology > Statistical methods.
Measurement > Mathematical models.
Espacios métricos > Modelos matemáticos
Measurement > Mathematical models
Electronic books.
Online Access:Click for online access
Table of Contents:
  • Introduction
  • Basic Measurement Concepts
  • The International System of Units, Traceability, and Calibration
  • Introduction to Statistics and Probability
  • Measurement Uncertainty in Decision Making
  • The Measurement Model and Uncertainty
  • Analytical Methods for the Propagation of Uncertainties
  • Monte Carlo Methods for the Propagation of Uncertainties
  • Design of Experiments in Metrology
  • Determining Uncertainties in Fitted Curves
  • Special Topics in Metrology.

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