3D microelectronic packaging : from architectures to applications / Yan Li, Deepak Goyal, editors.

This book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture, processing details, and applications of 3D microelectronic packaging. It provides readers an in-depth understanding of the latest research...

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Bibliographic Details
Other Authors: Li, Yan (Editor), Goyal, Deepak (Electrical engineer) (Editor)
Format: Electronic eBook
Language:English
Published: Singapore : Springer, [2021]
Edition:Second edition.
Series:Springer series in advanced microelectronics ; 64.
Subjects:
Online Access:Click for online access

MARC

LEADER 00000cam a2200000 i 4500
001 on1228845681
003 OCoLC
005 20240808213014.0
006 m o d
007 cr |||||||||||
008 201123s2021 si ob 001 0 eng d
040 |a UPM  |b eng  |e rda  |e pn  |c UPM  |d OCLCO  |d OCLCQ  |d GW5XE  |d YDXIT  |d EBLCP  |d DCT  |d LEATE  |d OCLCO  |d OCLCQ  |d OCLCO  |d COM  |d N$T  |d OCLCQ  |d OCLCO  |d OCLCL 
019 |a 1224370547  |a 1237463113  |a 1238203437  |a 1241066621  |a 1249943768  |a 1311413669 
020 |a 9789811570902  |q (electronic book) 
020 |a 9811570906  |q (electronic book) 
020 |z 9789811570896 
024 7 |a 10.1007/978-981-15-7090-2  |2 doi 
035 |a (OCoLC)1228845681  |z (OCoLC)1224370547  |z (OCoLC)1237463113  |z (OCoLC)1238203437  |z (OCoLC)1241066621  |z (OCoLC)1249943768  |z (OCoLC)1311413669 
037 |b Springer 
050 4 |a TK7874  |b .T57 2021 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
072 7 |a TJFC  |2 thema 
072 7 |a TJFD  |2 thema 
072 7 |a TEC  |x 008070  |2 bisacsh 
072 7 |a TJF  |2 bicssc 
049 |a HCDD 
245 0 0 |a 3D microelectronic packaging :  |b from architectures to applications /  |c Yan Li, Deepak Goyal, editors. 
246 3 |a Three Dimensional microelectronic packaging 
250 |a Second edition. 
264 1 |a Singapore :  |b Springer,  |c [2021] 
300 |a 1 online resource 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file 
347 |b PDF 
490 1 |a Springer series in advanced microelectronics,  |x 1437-0387 ;  |v volume 64 
504 |a Includes bibliographical references and index. 
520 |a This book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture, processing details, and applications of 3D microelectronic packaging. It provides readers an in-depth understanding of the latest research and development findings regarding this key industry trend, including TSV, die processing, micro-bumps for LMI and MMI, direct bonding and advanced materials, as well as quality, reliability, fault isolation, and failure analysis for 3D microelectronic packages. Images, tables, and didactic schematics are used to illustrate and elaborate on the concepts discussed. Readers will gain a general grasp of 3D packaging, quality and reliability concerns, and common causes of failure, and will be introduced to developing areas and remaining gaps in 3D packaging that can help inspire future research and development. 
505 0 |a 1. Introduction to 3D microelectronic packaging -- 2. 3D packaging architecture and assembly process design -- 3. Fundamentals of TSV processing and reliability -- 4. Mechanical properties of TSV -- 5. Atomistic View of TSV Protrusion/Intrusion -- 6. Fundamentals and failures in Die preparation for 3D packaging -- 7. Direct Cu to Cu bonding and other alternative interconnects in 3D packaging -- 8. Emerging hybrid bonding techniques for 3D packaging -- 9. Fundamental of Thermal Compressive Bonding process, advanced epoxy, and flux materials in 3D packaging -- 10. Fundamentals of solder alloys in 3D packaging -- 11. Fundamentals of electro migration in interconnects of 3D packages -- 12. Fundamentals of heat dissipation in 3D packaging -- 13. Fundamentals of advanced materials and process in substrate technology -- 14. New substrate technologies for 3D packaging.-15. Thermal mechanical and moisture modeling in 3D packaging -- 16. Stress and Strain measurements in 3D packaging -- 17. Processing and Reliability of Solder Interconnections in Stacked Packaging -- 18. Interconnect Quality and Reliability of 3D Packaging -- 19. Fundamentals of automotive reliability of 3D packages -- 20. Fault isolation and failure analysis of 3D packaging. 
588 0 |a Online resource; title from digital title page (viewed on February 02, 2021). 
650 0 |a Microelectronics  |x Packaging. 
650 0 |a Electronic circuits. 
650 0 |a Electronics. 
650 0 |a Optical materials. 
650 0 |a Electronics  |x Materials. 
650 0 |a Biotechnology. 
650 0 |a Nanotechnology. 
650 0 |a Metals. 
650 7 |a bioengineering.  |2 aat 
650 7 |a metal.  |2 aat 
650 7 |a Biotechnology  |2 fast 
650 7 |a Electronic circuits  |2 fast 
650 7 |a Electronics  |2 fast 
650 7 |a Electronics  |x Materials  |2 fast 
650 7 |a Engineering  |2 fast 
650 7 |a Metals  |2 fast 
650 7 |a Microelectronics  |2 fast 
650 7 |a Nanotechnology  |2 fast 
650 7 |a Optical materials  |2 fast 
700 1 |a Li, Yan,  |e editor. 
700 1 |a Goyal, Deepak  |c (Electrical engineer),  |e editor.  |1 https://id.oclc.org/worldcat/entity/E39PCjxwkQTc9YxPWC3BQ6g83P 
758 |i has work:  |a 3D microelectronic packaging (Text)  |1 https://id.oclc.org/worldcat/entity/E39PCGWkVJcqVcrc8YPrCC4g8C  |4 https://id.oclc.org/worldcat/ontology/hasWork 
776 0 8 |i Printed edition:  |z 9789811570896 
776 0 8 |i Printed edition:  |z 9789811570919 
776 0 8 |i Printed edition:  |z 9789811570926 
830 0 |a Springer series in advanced microelectronics ;  |v 64.  |x 1437-0387 
856 4 0 |u https://holycross.idm.oclc.org/login?auth=cas&url=https://link.springer.com/10.1007/978-981-15-7090-2  |y Click for online access 
903 |a springengine2021 
994 |a 92  |b HCD