Genomic designing for biotic stress resistant pulse crops / Chittaranjan Kole, editor.

Biotic stresses cause yield loss of 31-42% in crops in addition to 6-20% during post-harvest stage. Understanding interaction of crop plants to the biotic stresses caused by insects, bacteria, fungi, viruses, and oomycetes, etc. is important to develop resistant crop varieties. Knowledge on the adva...

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Bibliographic Details
Other Authors: Kole, Chittaranjan (Editor)
Format: eBook
Language:English
Published: Cham, Switzerland : Springer, 2022.
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