Thermal reliability of power semiconductor device in the renewable energy system / Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du.
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing r...
Full description
Saved in:
Bibliographic Details
| Main Authors: |
Du, Xiong
(Author),
Zhang, Jun
(Author),
Li, Gaoxian
(Author),
Yu, Yaoyi
(Author),
Qian, Cheng
(Author),
Du, Rui
(Author) |
|---|
| Format: | eBook
|
|---|
| Language: | English |
|---|
| Published: |
Singapore :
Springer,
[2022]
|
|---|
| Series: | CPSS power electronics series.
|
|---|
| Subjects: | |
|---|
| Online Access: | Click for online access
|
|---|