Thermal reliability of power semiconductor device in the renewable energy system / Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du.

This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing r...

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Bibliographic Details
Main Authors: Du, Xiong (Author), Zhang, Jun (Author), Li, Gaoxian (Author), Yu, Yaoyi (Author), Qian, Cheng (Author), Du, Rui (Author)
Format: eBook
Language:English
Published: Singapore : Springer, [2022]
Series:CPSS power electronics series.
Subjects:
Online Access:Click for online access

MARC

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020 |z 9789811931314 
020 |z 9811931313 
024 7 |a 10.1007/978-981-19-3132-1  |2 doi 
035 |a (OCoLC)1335120409  |z (OCoLC)1335114404 
050 4 |a TK7871.85 
072 7 |a TEC031000  |2 bisacsh 
049 |a HCDD 
100 1 |a Du, Xiong,  |e author. 
245 1 0 |a Thermal reliability of power semiconductor device in the renewable energy system /  |c Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du. 
264 1 |a Singapore :  |b Springer,  |c [2022] 
264 4 |c ©2022 
300 |a 1 online resource :  |b illustrations (some color). 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a CPSS power electronics series 
504 |a Includes bibliographical references. 
520 |a This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. . 
505 0 |a Introduction -- Thermal fatigue failure mechanism of power devices in renewable energy system -- Thermal model and thermal parameters monitoring -- Thermal analysis of power semiconductor device in renewable energy system -- Multi-time scale lifetime evaluation for the device in the renewable application -- Thermal management design and optimization -- Prospect. 
588 0 |a Print version record. 
650 0 |a Power semiconductors. 
650 0 |a Renewable energy sources. 
650 7 |a Power semiconductors  |2 fast 
650 7 |a Renewable energy sources  |2 fast 
700 1 |a Zhang, Jun,  |e author. 
700 1 |a Li, Gaoxian,  |e author. 
700 1 |a Yu, Yaoyi,  |e author. 
700 1 |a Qian, Cheng,  |e author. 
700 1 |a Du, Rui,  |e author. 
776 0 8 |i Print version:  |a Du, Xiong.  |t Thermal reliability of power semiconductor device in the renewable energy system.  |d Singapore : Springer Nature Singapore, 2022  |z 9789811931314  |w (OCoLC)1328015829 
830 0 |a CPSS power electronics series. 
856 4 0 |u https://holycross.idm.oclc.org/login?auth=cas&url=https://link.springer.com/10.1007/978-981-19-3132-1  |y Click for online access 
903 |a SPRING-ENERGY2022 
994 |a 92  |b HCD